APD 2000 Pro

Laboratory X-Ray Diffractometer

APD 2000 PRO Diffractometer is designed to be the best solution for phase and structural analysis of powder samples. It could be equipped with various attachments for your special field of research.

100%

Made in Italy

Quality control in metal

analysis using OES/RDE

Material properties control

using XRD/TXRF

World Wide

Distribution

Complete Description

APD 2000 PRO diffractometer is an high power – Theta/Theta – laboratory powder X-Ray Diffractometer equipped with all the most moder technical features which grant accuracy, precision, safety and easiness of use for XRD analysis of polycrystalline materials.

Thanks to a wide offer of configurations and accessories such as high-speed detector, scintillation counter, high-low temperature and humidity chamber, secondary monochromator, spinner and multiple sample holder, APD 2000 PRO is a powerful tool for powder diffraction applications such as routinary qualitative and quantitative phase analysis, non-ambient analysis, structure solution and refinement, crystallite size and degree of crystallinity calculation.

  • High Speed Rate (1000°/min) 
  • High Precision Angle Reproducibility (+/- 0.0001°) 
  • Fast Measurement and Highly Reliable Data 
  • Extremely precise angular values thanks to stepper motors with optical encoders 
  • Easy to handle 

 

APD 2000 PRO Key Features

  • Qualiltative and Quantitative Powder X-Ray Diffractometer
  • High Stability X-Ray generator through precision feedback control circuits
  • Automatic ramp of the high voltage and emission current to preset values
  • Ceramic X-Ray tubes with high reproducibility and stability of focus position
  • Microfocus tubes and policapillary collimators
  • Possibility of changing automatically from transmission to reflection mode
  • High precision, high speed goniometer controlled by optical encoders
  • Traditional, rotating, multi sample and capillary sample holders
  • Scintillation counters, silicon strip and energy dispersive detectors
  • Non-ambient analysis, low and high temperature chambers, humidity device

 

Product Applications

Qualitative and quantitative phase analysis, non-ambient analysis, retained austenite quantification, structure solution and refinement, crystallite size and crystallinity calculations.

  • Geology and Mineralogy / Clays
  • Glass / Ceramics / Cement
  • Chemicals / Petrochemicals
  • Catalyst / Polymers
  • Forensics
  • Agricultural Sciences
  • Biosciences / Environmental
  • Pharmaceuticals
  • Cosmetics
  • Art and Archeology

Technical Data

X Ray Generator
Maximum Output Power: 3 kW
Max Output Voltage: 60 kV
Max Output Current: 60 mA
X-Ray Tube
Glass (option ceramic), Cu anode (option: Co, Fe, Cr, Mo, W, Ag)
Focus: 0.4 x 8 mm FF (Fine Focus) (options: 0.4 x 12 mm LFF; 1 x 10 mm NF)
Goniometer
Configurations: Theta/Theta geometry
Measuring circle radius: 160 mm
Scanning Angular Range: – 5° < 2-Theta < + 160° (according to accessories)
Angle positioning: Stepping motors with optical encoders
Angular accuracy: better than ± 0.02° over the whole 2-Theta range
Angular resolution: < 0.04 2-Theta on LaB6 (110) peak
Detector
1D/2D detectors
Silicon Drift Detectors (SDDs)
Case
External Dimensions: 950 W x 789 D x 1952 H mm
Leakage X-rays< 1 mSv/Year (full safety shielding according to the international guidelines)
Processing Unit
Computer Type: Personal Computer, the latest version
Items controlled: X-ray generator, goniometer, sample holder, detector, counting chain

Software Informations

Data Collection Programs
GNR offers a large variety of acquisition programs, for standard as well as for customized hardware configurations. the list includes programs for powder and high resolution diffractometers, retained austenite, data acquisition of stress (plane and triaxial) and thin films (XRD and GIXRD).

SAX
Single peak analysis; peak treatment. Background subtraction, smoothing, deconvolution and peak localisation. Structural Analysis, Crystallite Size, Lattice Strain, Reflectometry, Quantitative Analysis.

Search and Match: MATCH!
Rietveld refinement, Display and compare multiple diffraction partners, Directly view specific phases/entries, instant usage of additional information, saving of selection criteria, Comfortable definition of background, Improved zooming facilities, Batch processing and Automatics.

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Contact Us to request info

Fill out the form with all the required information or contact us via alternative contact methods. We will reply within 48 hours.

Do you need contacts outside Italy? Consult the list of our partners around the world to find out who to contact.

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