Horizon is the new Benchtop Total Reflection X-Ray Fluorescence Spectrometer (TXRF) for multi elemental qualitative and quantitative analyses for major constituents and ultra-trace in suspension as well as liquid samples.
TXRF is a type of Energy Dispersive X-Ray Fluorescence (EDXRF) in which the X-Ray beam strikes the sample, deposited as a thin layer on a carrier, at a very small incident angle, in order to exploit the excitation enhancement given by the total reflection effect. As far as the sample is thin enough (thin film approximation), the technique’s main strengts are:
- simultaneous multi-element analysis from Na to Pu
- no matrix effect
- no matrix-dependent calibration curves
- improved detection limits (LOD) down to ng/g or lower
- minimum amount of sample
- microanalysis capabilities
Horizon is the state of the art of the Total Reflection X-Ray Fluorescence spectrometer and it is equipped with all the most modern technical components, which grant accuracy, precision, safety and easiness of use.
It is a powerful tool for trace analysis at an affordable price.
